PARMI Xceed’s advantages mainly include the following aspects:
Inspection speed and accuracy: PARMI Xceed adopts 3D laser scanning method, which has the fastest inspection speed in the same field, reaching 15 cm²/sec. Its inspection accuracy is also very high, and it can cope with a variety of semiconductor processes, such as SiP, Tiny chips (0201~0402), molds, etc.
Wide range of inspection items: Xceed 3D AOI can inspect multiple items, including size, missing parts, offset, wrong parts, side stand, monument, text, solder joints, pin lift, missing pins, pin offset, pin, tin connection, ribbon, crimping, etc.
Adapt to multiple platforms: Xceed PropertyGrid supports multiple data formats and property types, including JSON, XML, HTML and CSV, and is suitable for multiple platforms such as Windows, Linux and Mac OS X
User-friendly and efficient: Xceed PropertyGrid has an insightful interface and rich API, which is easy to use and manage. Its open source nature also means that users can get long-term maintenance and support.
High-performance user experience: Xceed DataGrid for WPF provides a rich, smooth and high-performance user experience, supports asynchronous data virtualization and modern smooth scrolling, and the mechanism can remain responsive even when processing large amounts of data.